SD Particle Inspection system was developed by Eisai in 1976.

Solution within the container keeps rotating for some time with force of habit when container is stopped after high speed spin rotation. Under this condition, light-beam is applied to container and reaches to sensor. As solution moves, foreign particle moves blocking off the light beam. This results in the variation in light intensity that sensor receives. This change in intensity is converted into electric signal for particle inspection.

SD Inspection system is not affected by flaw/dirt, characteristics of solution and printing on container wall and provides high detection rate of particle inspection with highest reliability. Over 800 units of Automatic Inspection Machines with SD Particle Inspection System have been delivered to 48 countries in the world.